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ESD-Immunity Influence of Ultra-high Voltage nLDMOS as the ..:

, In: 2019 IEEE Eurasia Conference on IOT, Communication and Engineering (ECICE),
Lin, Po-Lin ; Chen, Shen-Li ; Fan, Sheng-Kai... - p. 411-412 , 2019
Link: https://doi.org/10.1109/ECICE47484.2019.8942662