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1 Ergebnisse
1
Design of Vision Assistant System for an Atomic Force Micro..:
, In:
2019 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)
,
Ren, Yifei
;
Fan, Zhi
;
Wu, Yinan
.. - p. 270-275 , 2019
Link:
https://doi.org/10.1109/3M-NANO46308.2019.8947393
RT T1 <cTitle>2019 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)</cTitle>: T1 <Title>Design of Vision Assistant System for an Atomic Force Microscopy Based on Object Detection</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8947393&Exemplar=1&LAN=DE A1 Ren, Yifei A1 Fan, Zhi A1 Wu, Yinan A1 Liu, Cunhuan A1 Wang, Chao YR 2019 K1 Information entropy K1 Visualization K1 Optical microscopy K1 Object detection K1 Force K1 Atomic force microscopy K1 atomic force microscopy K1 optical microscopy K1 focus assessment K1 object distribution evaluation K1 object detection SP 270 OP 275 LK http://dx.doi.org/https://doi.org/10.1109/3M-NANO46308.2019.8947393 DO https://doi.org/10.1109/3M-NANO46308.2019.8947393 SF ELIB - SuUB Bremen
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