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Tin Whisker Growth Mechanism on Tin Plating of MLCCs Mounte..:
, In:
2019 22nd European Microelectronics and Packaging Conference & Exhibition (EMPC)
,
Saito, Akira
;
Nishikawa, Hiroshi
- p. 1-4 , 2019
Link:
https://doi.org/10.23919/EMPC44848.2019.8951817
RT T1
2019 22nd European Microelectronics and Packaging Conference & Exhibition (EMPC)
: T1
Tin Whisker Growth Mechanism on Tin Plating of MLCCs Mounted with Sn-3.5Ag-8In-0.5Bi Solder in 30°C60%RH
UL https://suche.suub.uni-bremen.de/peid=ieee-8951817&Exemplar=1&LAN=DE A1 Saito, Akira A1 Nishikawa, Hiroshi YR 2019 K1 Tin K1 Plating K1 Testing K1 Soldering K1 Lead K1 Image edge detection K1 Scanning electron microscopy K1 Tin whisker K1 Indium K1 Low-temperature soldering K1 Termination K1 MLCC SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.23919/EMPC44848.2019.8951817 DO https://doi.org/10.23919/EMPC44848.2019.8951817 SF ELIB - SuUB Bremen
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