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1 Ergebnisse
1
A Highly Accurate Machine Learning Approach to Modelling PV..:
, In:
2019 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)
,
Gourishetty, Shirisha
;
Mandadapu, Harshini
;
Zahra, Andleeb
. - p. 61-64 , 2019
Link:
https://doi.org/10.1109/APCCAS47518.2019.8953073
RT T1
2019 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)
: T1
A Highly Accurate Machine Learning Approach to Modelling PVT Variation Aware Leakage Power in FinFET Digital Circuits
UL https://suche.suub.uni-bremen.de/peid=ieee-8953073&Exemplar=1&LAN=DE A1 Gourishetty, Shirisha A1 Mandadapu, Harshini A1 Zahra, Andleeb A1 Abbas, Zia YR 2019 K1 Integrated circuit modeling K1 SPICE K1 Computational modeling K1 Standards K1 FinFETs K1 Training K1 Logic gates K1 Machine Learning K1 Neural Networks K1 Polynomial Regression K1 Statistical Variations K1 Leakage Power K1 FinFET K1 VLSI SP 61 OP 64 LK http://dx.doi.org/https://doi.org/10.1109/APCCAS47518.2019.8953073 DO https://doi.org/10.1109/APCCAS47518.2019.8953073 SF ELIB - SuUB Bremen
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