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Novel X-band Loaded Circular Aperture Probe for Imaging of ..:
, In:
2019 International Conference on Electrical and Computing Technologies and Applications (ICECTA)
,
Saif ur Rahman, Mohammed
;
Al-Wahedi, Khaled
;
Abou-Khousa, Mohamed A.
. - p. 1-4 , 2019
Link:
https://doi.org/10.1109/ICECTA48151.2019.8959667
RT T1 <cTitle>2019 International Conference on Electrical and Computing Technologies and Applications (ICECTA)</cTitle>: T1 <Title>Novel X-band Loaded Circular Aperture Probe for Imaging of Multilayer Composites</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8959667&Exemplar=1&LAN=DE A1 Saif ur Rahman, Mohammed A1 Al-Wahedi, Khaled A1 Abou-Khousa, Mohamed A. A1 Akhter, Zubair YR 2019 K1 circular aperture probe K1 composites K1 near-field microwave imaging K1 non-destructive testing SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICECTA48151.2019.8959667 DO https://doi.org/10.1109/ICECTA48151.2019.8959667 SF ELIB - SuUB Bremen
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