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1 Ergebnisse
1
Ball-Grid-Array Chip Defects Detection and Classification U..:
, In:
2019 International Conference on Technologies and Applications of Artificial Intelligence (TAAI)
,
Le, Phong-Phu
;
Guo, Shu-Mei
;
Chen, Ju-Chin
. - p. 1-6 , 2019
Link:
https://doi.org/10.1109/TAAI48200.2019.8959827
RT T1 <cTitle>2019 International Conference on Technologies and Applications of Artificial Intelligence (TAAI)</cTitle>: T1 <Title>Ball-Grid-Array Chip Defects Detection and Classification Using Patch-based Modified YOLOv3</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8959827&Exemplar=1&LAN=DE A1 Le, Phong-Phu A1 Guo, Shu-Mei A1 Chen, Ju-Chin A1 Lien, Jenn-Jier James YR 2019 SN 2376-6824 K1 Feature extraction K1 Detectors K1 Integrated circuits K1 Deep learning K1 Convolutional neural networks K1 Task analysis K1 Computer science K1 Object Detection and classification K1 Ball-Grid-Array Chip Defect K1 YOLOv3 K1 Defect Detection SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/TAAI48200.2019.8959827 DO https://doi.org/10.1109/TAAI48200.2019.8959827 SF ELIB - SuUB Bremen
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