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Reliability and Accelerated Testing of 14nm FinFET Ring Osc..:

, In: 2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS),
Hsu, Shu-Han ; Yang, Kexin ; Milor, Linda - p. 1-7 , 2019
Link: https://doi.org/10.1109/DCIS201949030.2019.8959834