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1 Ergebnisse
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Reliability and Accelerated Testing of 14nm FinFET Ring Osc..:
, In:
2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS)
,
Hsu, Shu-Han
;
Yang, Kexin
;
Milor, Linda
- p. 1-7 , 2019
Link:
https://doi.org/10.1109/DCIS201949030.2019.8959834
RT T1
2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS)
: T1
Reliability and Accelerated Testing of 14nm FinFET Ring Oscillators
UL https://suche.suub.uni-bremen.de/peid=ieee-8959834&Exemplar=1&LAN=DE A1 Hsu, Shu-Han A1 Yang, Kexin A1 Milor, Linda YR 2019 SN 2640-5563 K1 Ring oscillators K1 Testing K1 Temperature distribution K1 Integrated circuit modeling K1 Integrated circuit reliability K1 14nm FinFET K1 ring oscillator K1 accelerated testing K1 gate oxide breakdown SP 1 OP 7 LK http://dx.doi.org/https://doi.org/10.1109/DCIS201949030.2019.8959834 DO https://doi.org/10.1109/DCIS201949030.2019.8959834 SF ELIB - SuUB Bremen
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