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1 Ergebnisse
1
Complexed Shape Micro Defects Inspection By High Sensitivit..:
, In:
2019 Far East NDT New Technology & Application Forum (FENDT)
,
Ma, Qiu Ping
;
Gao, Bin
;
Tian, Gui Yun
.. - p. 110-114 , 2019
Link:
https://doi.org/10.1109/FENDT47723.2019.8962592
RT T1 <cTitle>2019 Far East NDT New Technology & Application Forum (FENDT)</cTitle>: T1 <Title>Complexed Shape Micro Defects Inspection By High Sensitivity Flexible TRT Eddy Current Array</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8962592&Exemplar=1&LAN=DE A1 Ma, Qiu Ping A1 Gao, Bin A1 Tian, Gui Yun A1 Rong Yang, Chang A1 Chen, Ke-fan YR 2019 K1 Non-destructive testing K1 flexible eddy current array K1 near surface cracks inspection K1 high sensitivity SP 110 OP 114 LK http://dx.doi.org/https://doi.org/10.1109/FENDT47723.2019.8962592 DO https://doi.org/10.1109/FENDT47723.2019.8962592 SF ELIB - SuUB Bremen
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