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1 Ergebnisse
1
Imaging-based NDT Methods for Electronic Devices:
, In:
2019 Far East NDT New Technology & Application Forum (FENDT)
,
Li, Kongjing
;
Yun Tian, Gui
;
Wang, Yangang
- p. 53-58 , 2019
Link:
https://doi.org/10.1109/FENDT47723.2019.8962722
RT T1 <cTitle>2019 Far East NDT New Technology & Application Forum (FENDT)</cTitle>: T1 <Title>Imaging-based NDT Methods for Electronic Devices</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8962722&Exemplar=1&LAN=DE A1 Li, Kongjing A1 Yun Tian, Gui A1 Wang, Yangang YR 2019 K1 Non-destructive testing (NDT) K1 electronic devices SP 53 OP 58 LK http://dx.doi.org/https://doi.org/10.1109/FENDT47723.2019.8962722 DO https://doi.org/10.1109/FENDT47723.2019.8962722 SF ELIB - SuUB Bremen
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