I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Test Architecture for Fine Grained Capture Power Reduction:

, In: 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS),
Sun, Yi ; Jiang, Hui ; Ramakrishnan, Lakshmi... - p. 558-561 , 2019
Link: https://doi.org/10.1109/ICECS46596.2019.8964790