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1 Ergebnisse
1
Read Threshold Calibration for Non-Volatile Flash Memories:
, In:
2019 IEEE 9th International Conference on Consumer Electronics (ICCE-Berlin)
,
Rajab, Mohammed
;
Thiers, Johann-Philipp
;
Freudenberger, Jurgen
- p. 109-113 , 2019
Link:
https://doi.org/10.1109/ICCE-Berlin47944.2019.8966181
RT T1 <cTitle>2019 IEEE 9th International Conference on Consumer Electronics (ICCE-Berlin)</cTitle>: T1 <Title>Read Threshold Calibration for Non-Volatile Flash Memories</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8966181&Exemplar=1&LAN=DE A1 Rajab, Mohammed A1 Thiers, Johann-Philipp A1 Freudenberger, Jurgen YR 2019 SN 2166-6822 K1 Threshold voltage K1 Calibration K1 Error probability K1 Bit error rate K1 Voltage measurement K1 Decoding K1 Error correction codes SP 109 OP 113 LK http://dx.doi.org/https://doi.org/10.1109/ICCE-Berlin47944.2019.8966181 DO https://doi.org/10.1109/ICCE-Berlin47944.2019.8966181 SF ELIB - SuUB Bremen
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