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1 Ergebnisse
1
Efficient Ising Model Mapping for Induced Subgraph Isomorph..:
, In:
2019 IEEE 9th International Conference on Consumer Electronics (ICCE-Berlin)
,
Yoshimura, Natsuhito
;
Tawada, Masashi
;
Tanaka, Shu
... - p. 227-232 , 2019
Link:
https://doi.org/10.1109/ICCE-Berlin47944.2019.8966218
RT T1 <cTitle>2019 IEEE 9th International Conference on Consumer Electronics (ICCE-Berlin)</cTitle>: T1 <Title>Efficient Ising Model Mapping for Induced Subgraph Isomorphism Problems Using Ising Machines</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8966218&Exemplar=1&LAN=DE A1 Yoshimura, Natsuhito A1 Tawada, Masashi A1 Tanaka, Shu A1 Arai, Junya A1 Yagi, Satoshi A1 Uchiyama, Hiroyuki A1 Togawa, Nozomu YR 2019 SN 2166-6822 K1 induced subgraph K1 isomorphism problem K1 Ising machines K1 Ising model K1 annealing machine SP 227 OP 232 LK http://dx.doi.org/https://doi.org/10.1109/ICCE-Berlin47944.2019.8966218 DO https://doi.org/10.1109/ICCE-Berlin47944.2019.8966218 SF ELIB - SuUB Bremen
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