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1 Ergebnisse
1
Deep Technology Tracing for High-Tech Companies:
, In:
2019 IEEE International Conference on Data Mining (ICDM)
,
Wu, Han
;
Zhang, Kun
;
Lv, Guangyi
... - p. 1396-1401 , 2019
Link:
https://doi.org/10.1109/ICDM.2019.00180
RT T1 <cTitle>2019 IEEE International Conference on Data Mining (ICDM)</cTitle>: T1 <Title>Deep Technology Tracing for High-Tech Companies</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8970847&Exemplar=1&LAN=DE A1 Wu, Han A1 Zhang, Kun A1 Lv, Guangyi A1 Liu, Qi A1 Yu, Runlong A1 Zhao, Weihao A1 Chen, Enhong A1 Ma, Jianhui YR 2019 SN 2374-8486 K1 Technology Prospecting, Patent Mining, Business Planning, Deep Learning Application SP 1396 OP 1401 LK http://dx.doi.org/https://doi.org/10.1109/ICDM.2019.00180 DO https://doi.org/10.1109/ICDM.2019.00180 SF ELIB - SuUB Bremen
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