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1 Ergebnisse
1
Chatter Detection in Hot Strip Mill Process based on Modifi..:
, In:
2019 IEEE 17th International Conference on Industrial Informatics (INDIN)
,
Jo, Ha-Nui
;
Park, Byeong Eon
;
Ji, Yumi
... - p. 455-458 , 2019
Link:
https://doi.org/10.1109/INDIN41052.2019.8972064
RT T1
2019 IEEE 17th International Conference on Industrial Informatics (INDIN)
: T1
Chatter Detection in Hot Strip Mill Process based on Modified Independent Component Analysis
UL https://suche.suub.uni-bremen.de/peid=ieee-8972064&Exemplar=1&LAN=DE A1 Jo, Ha-Nui A1 Park, Byeong Eon A1 Ji, Yumi A1 Kim, Dong-Kuk A1 Yang, Jeong Eun A1 Lee, In-Beum A1 Hong, Jeong Byeol YR 2019 SN 2378-363X K1 chatter phenomenon K1 fault detection K1 hot strip mill process K1 modified independent component analysis SP 455 OP 458 LK http://dx.doi.org/https://doi.org/10.1109/INDIN41052.2019.8972064 DO https://doi.org/10.1109/INDIN41052.2019.8972064 SF ELIB - SuUB Bremen
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