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1 Ergebnisse
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DC and RF Variability of SiGe HBTs Operating Down to Deep C..:
, In:
2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS)
,
Ying, Hanbin
;
Teng, Jeffrey W.
;
Tzintzarov, George N.
... - p. 1-4 , 2019
Link:
https://doi.org/10.1109/BCICTS45179.2019.8972709
RT T1
2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS)
: T1
DC and RF Variability of SiGe HBTs Operating Down to Deep Cryogenic Temperatures
UL https://suche.suub.uni-bremen.de/peid=ieee-8972709&Exemplar=1&LAN=DE A1 Ying, Hanbin A1 Teng, Jeffrey W. A1 Tzintzarov, George N. A1 Omprakash, Anup P. A1 Rao, Sunil G. A1 Raghunathan, Uppili A1 Ildefonso, Adrian A1 Fernandez, Martin S. A1 Cressler, John D. YR 2019 K1 Integrated circuits K1 Cryogenics K1 Silicon germanium K1 Current measurement K1 Semiconductor device measurement K1 Radio frequency K1 Cryogenic K1 SiGe K1 BiCMOS K1 quantum computing K1 readout circuits SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/BCICTS45179.2019.8972709 DO https://doi.org/10.1109/BCICTS45179.2019.8972709 SF ELIB - SuUB Bremen
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