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1 Ergebnisse
1
Monte Carlo Investigation of Traveling Accumulation Layers ..:
, In:
2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS)
,
Sculley, Jonathan P.
;
Markman, Brian
;
Soylu, Utku
... - p. 1-4 , 2019
Link:
https://doi.org/10.1109/BCICTS45179.2019.8972778
RT T1
2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS)
: T1
Monte Carlo Investigation of Traveling Accumulation Layers in InP Heterojunction Bipolar Transistor Power Amplifiers
UL https://suche.suub.uni-bremen.de/peid=ieee-8972778&Exemplar=1&LAN=DE A1 Sculley, Jonathan P. A1 Markman, Brian A1 Soylu, Utku A1 Fang, Yihao A1 Urteaga, Miguel E. A1 Carter, Andy D. A1 Rodwell, Mark J. W. A1 Yoder, Paul D. YR 2019 K1 InP HBT K1 velocity modulation K1 transit-time modulation K1 Gunn effect K1 transferred electron effect K1 Monte Carlo simulation K1 IM3 distortion SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/BCICTS45179.2019.8972778 DO https://doi.org/10.1109/BCICTS45179.2019.8972778 SF ELIB - SuUB Bremen
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