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Management of Layout Matching of Objects of Complex Microel..:
, In:
2019 III International Conference on Control in Technical Systems (CTS)
,
Mironov, S. E.
;
Zibarev, K. M.
- p. 69-73 , 2019
Link:
https://doi.org/10.1109/CTS48763.2019.8973275
RT T1 <cTitle>2019 III International Conference on Control in Technical Systems (CTS)</cTitle>: T1 <Title>Management of Layout Matching of Objects of Complex Microelectronic Systems with Uncertainty of Design Rules</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8973275&Exemplar=1&LAN=DE A1 Mironov, S. E. A1 Zibarev, K. M. YR 2019 K1 uncertainty of design rules K1 process-tolerant design K1 complex objects of microelectronic systems K1 layout compaction K1 close-packed design K1 cells matching SP 69 OP 73 LK http://dx.doi.org/https://doi.org/10.1109/CTS48763.2019.8973275 DO https://doi.org/10.1109/CTS48763.2019.8973275 SF ELIB - SuUB Bremen
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