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Training Convolutional Autoencoders with Metric Learning:

, In: 2019 International Conference on Document Analysis and Recognition (ICDAR),
Onitsuka, Yosuke ; Ohyama, Wataru ; Uchida, Seiichi - p. 86-91 , 2019
Link: https://doi.org/10.1109/ICDAR.2019.00023