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1 Ergebnisse
1
In-situ Microscopy Characterization of Cu(In,Ga)Se2 Potenti..:
, In:
2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)
,
Xiao, Chuanxiao
;
Jiang, Chun-Sheng
;
Harvey, Steven P.
... - p. 2342-2345 , 2019
Link:
https://doi.org/10.1109/PVSC40753.2019.8980888
RT T1
2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)
: T1
In-situ Microscopy Characterization of Cu(In,Ga)Se2 Potential-Induced Degradation
UL https://suche.suub.uni-bremen.de/peid=ieee-8980888&Exemplar=1&LAN=DE A1 Xiao, Chuanxiao A1 Jiang, Chun-Sheng A1 Harvey, Steven P. A1 Mansfield, Lorelle A1 Muzzillo, Christopher P. A1 Sulas, Dana A1 Liu, Jun A1 Johnston, Steve A1 Al-Jassim, Mowafak YR 2019 K1 CIGS K1 PID K1 in-situ microscopy K1 sodium K1 p-n junction SP 2342 OP 2345 LK http://dx.doi.org/https://doi.org/10.1109/PVSC40753.2019.8980888 DO https://doi.org/10.1109/PVSC40753.2019.8980888 SF ELIB - SuUB Bremen
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