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A High Reliability 500 µW Resistance-to-Digital Interface C..:

, In: 2019 IEEE 13th International Conference on ASIC (ASICON),
Yang, Jianguo ; Li, Xiaowen ; Ding, Qingting... - p. 1-4 , 2019
Link: https://doi.org/10.1109/ASICON47005.2019.8983585