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Dispatching Model of a Certain Test Platform:

, In: 2019 IEEE 3rd Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC),
Han, Zhen ; Wang, Peiyuan ; Yao, Xianghong. - p. 1071-1074 , 2019
Link: https://doi.org/10.1109/IMCEC46724.2019.8984153