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1 Ergebnisse
1
Modeling and Simulation of Diode Triggered Silicon Controll..:
, In:
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Miao, Meng
;
Li, You
;
Gauthier, Robert
- p. 1-4 , 2019
Link:
https://doi.org/10.1109/IPFA47161.2019.8984761
RT T1
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA)
: T1
Modeling and Simulation of Diode Triggered Silicon Controlled Rectifier Behavior under ESD Stresses
UL https://suche.suub.uni-bremen.de/peid=ieee-8984761&Exemplar=1&LAN=DE A1 Miao, Meng A1 Li, You A1 Gauthier, Robert YR 2019 SN 1946-1550 K1 ESD K1 Modeling K1 Snapback K1 Thermal failure SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IPFA47161.2019.8984761 DO https://doi.org/10.1109/IPFA47161.2019.8984761 SF ELIB - SuUB Bremen
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