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1 Ergebnisse
1
Comparative Study of Total Ionizing Dose Effects on the Sil..:
, In:
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Chen, Zhuojun
;
Lu, Wenzhao
;
Wu, Ming
... - p. 1-4 , 2019
Link:
https://doi.org/10.1109/IPFA47161.2019.8984825
RT T1
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA)
: T1
Comparative Study of Total Ionizing Dose Effects on the Silicon-Controlled Rectifier Devices for HV and LV ESD Protections
UL https://suche.suub.uni-bremen.de/peid=ieee-8984825&Exemplar=1&LAN=DE A1 Chen, Zhuojun A1 Lu, Wenzhao A1 Wu, Ming A1 Peng, Wei A1 Zeng, Yun A1 Jin, Xiangliang YR 2019 SN 1946-1550 K1 Electrostatic discharge (ESD) K1 Total ionizing dose (TID) K1 Low voltage (LV) K1 High voltage (HV) SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IPFA47161.2019.8984825 DO https://doi.org/10.1109/IPFA47161.2019.8984825 SF ELIB - SuUB Bremen
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