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EMMI Abnormal Hotspot Study for Latch up Simulation:

, In: 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA),
Chia-Sheng, Huang ; Xuan-Chao, Guo ; Zhi-Wei, Chen... - p. 1-4 , 2019
Link: https://doi.org/10.1109/IPFA47161.2019.8984832