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1 Ergebnisse
1
Increased Fault Isolation Efficiency by Using Scan Cell Vis..:
, In:
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Thin Wei, Peter Chua
;
Loke Sheng, Foo
;
Choo, Ng Kim
... - p. 1-9 , 2019
Link:
https://doi.org/10.1109/IPFA47161.2019.8984846
RT T1
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA)
: T1
Increased Fault Isolation Efficiency by Using Scan Cell Visualizer for Scan Chain Failures
UL https://suche.suub.uni-bremen.de/peid=ieee-8984846&Exemplar=1&LAN=DE A1 Thin Wei, Peter Chua A1 Loke Sheng, Foo A1 Choo, Ng Kim A1 Serrels, Keith A. A1 Ku, Kuyt A1 Lin, Curt A1 Chih-yi, Tang YR 2019 SN 1946-1550 K1 Scan Chain K1 Scan Cell Visualizer K1 Fault Isolation K1 Tessent Diagnosis SP 1 OP 9 LK http://dx.doi.org/https://doi.org/10.1109/IPFA47161.2019.8984846 DO https://doi.org/10.1109/IPFA47161.2019.8984846 SF ELIB - SuUB Bremen
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