I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Impact of low temperature on the TSG Vt shift during erase ..:
, In:
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Li, Da
;
Huo, Zongliang
;
Feng, Jianhua
... - p. 1-3 , 2019
Link:
https://doi.org/10.1109/IPFA47161.2019.8984850
RT T1
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA)
: T1
Impact of low temperature on the TSG Vt shift during erase cycling of 3-D NAND Flash memory
UL https://suche.suub.uni-bremen.de/peid=ieee-8984850&Exemplar=1&LAN=DE A1 Li, Da A1 Huo, Zongliang A1 Feng, Jianhua A1 Jin, Lei A1 Yan, Liang A1 Jia, Xinlei A1 Jia, Jianquan A1 Song, Yali A1 Zhang, An A1 Xu, Feng A1 Hou, Wei YR 2019 SN 1946-1550 K1 3D NAND Flash Memory K1 vertical channel K1 erase scheme K1 hot carrier injection K1 cycling SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/IPFA47161.2019.8984850 DO https://doi.org/10.1109/IPFA47161.2019.8984850 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)