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1 Ergebnisse
1
High-resolution 3D X-ray Microscopy for Structural Inspecti..:
, In:
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Mohammad-Zulkifli, Syahirah
;
Zee, Bernice
;
Thomas, Gregorich
... - p. 1-4 , 2019
Link:
https://doi.org/10.1109/IPFA47161.2019.8984854
RT T1
2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA)
: T1
High-resolution 3D X-ray Microscopy for Structural Inspection and Measurement of Semiconductor Package Interconnects
UL https://suche.suub.uni-bremen.de/peid=ieee-8984854&Exemplar=1&LAN=DE A1 Mohammad-Zulkifli, Syahirah A1 Zee, Bernice A1 Thomas, Gregorich A1 Gu, Allen A1 Yang, YanJing A1 Masako, Terada A1 Lee, Weijie YR 2019 SN 1946-1550 SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IPFA47161.2019.8984854 DO https://doi.org/10.1109/IPFA47161.2019.8984854 SF ELIB - SuUB Bremen
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