I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

High-resolution 3D X-ray Microscopy for Structural Inspecti..:

, In: 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA),
Mohammad-Zulkifli, Syahirah ; Zee, Bernice ; Thomas, Gregorich... - p. 1-4 , 2019
Link: https://doi.org/10.1109/IPFA47161.2019.8984854