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Leakage Current Degradation in SiC Junction Barrier Schottk..:

, In: 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA),
Shuang, Cao ; Qingkui, Yu ; Guanghua, Du... - p. 1-4 , 2019
Link: https://doi.org/10.1109/IPFA47161.2019.8984872