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In-depth Analysis of 10 nm Exynos Processor using Micro CT ..:

, In: 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA),
Sharang, S ; Dluhos, Jiri ; Kalasova, Dominika... - p. 1-4 , 2019
Link: https://doi.org/10.1109/IPFA47161.2019.8984907