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Low-Frequency Noise Measurements for Electromigration Chara..:

, In: 2019 IEEE International Integrated Reliability Workshop (IIRW),
Beyne, S. ; Croes, K. ; Pedreira, O. Varela... - p. 1-9 , 2019
Link: https://doi.org/10.1109/IIRW47491.2019.8989897