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1 Ergebnisse
1
Exploring Negative Bias Temperature Instability in Tri-Gate..:
, In:
2019 IEEE International Integrated Reliability Workshop (IIRW)
,
Myers, Kenneth J.
;
Lenahan, Patrick M.
;
Bittel, Brad C.
. - p. 1-4 , 2019
Link:
https://doi.org/10.1109/IIRW47491.2019.8989913
RT T1
2019 IEEE International Integrated Reliability Workshop (IIRW)
: T1
Exploring Negative Bias Temperature Instability in Tri-Gate MOSFETs through Electrically Detected Magnetic Resonance
UL https://suche.suub.uni-bremen.de/peid=ieee-8989913&Exemplar=1&LAN=DE A1 Myers, Kenneth J. A1 Lenahan, Patrick M. A1 Bittel, Brad C. A1 Meric, Inanc YR 2019 SN 2374-8036 K1 dielectrics K1 electrically detected magnetic resonance K1 FinFET K1 interface K1 leakage currents K1 MOSFET K1 negative bias temperature instability K1 tri-gate SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IIRW47491.2019.8989913 DO https://doi.org/10.1109/IIRW47491.2019.8989913 SF ELIB - SuUB Bremen
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