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Impact of Fin Height on Bias Temperature Instability of Mem..:

, In: 2019 IEEE International Integrated Reliability Workshop (IIRW),
Boubaaya, M. ; Benaceur-Doumaz, D. ; Ferhat Hamida, A.... - p. 1-5 , 2019
Link: https://doi.org/10.1109/IIRW47491.2019.8989914