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Advances in Artefact Quality Analysis for Safety-Critical S..:

, In: 2019 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW),
Parra, Eugenio ; Alonso, Luis ; Mendieta, Roy. - p. 79-84 , 2019
Link: https://doi.org/10.1109/ISSREW.2019.00047