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High-definition Visible-SWIR InGaAs Image Sensor using Cu-C..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Manda, S. ; Matsumoto, R. ; Saito, S.... - p. 16.7.1-16.7.4 , 2019
Link: https://doi.org/10.1109/IEDM19573.2019.8993432