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Impact Ionization Coefficients in GaN Measured by Above- an..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Maeda, Takuya ; Narita, Tetsuo ; Yamada, Shinji... - p. 4.2.1-4.2.4 , 2019
Link: https://doi.org/10.1109/IEDM19573.2019.8993438