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Reliability and Variability of 1S1R OxRAM-OTS for High Dens..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Robayo, D. Alfaro ; Deleruyelle, D. ; Vianello, E.... - p. 35.3.1-35.3.4 , 2019
Link: https://doi.org/10.1109/IEDM19573.2019.8993439