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Endurance improvement of more than five orders in GexSe1-x ..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Hatem, F. ; Zhang, J. F. ; Marsland, J.... - p. 35.2.1-35.2.4 , 2019
Link: https://doi.org/10.1109/IEDM19573.2019.8993448