I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

State-of-the-art TCAD: 25 years ago and today:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Stettler, M. ; Slepko, A. ; Smith, S.... - p. 39.1.1-39.1.4 , 2019
Link: https://doi.org/10.1109/IEDM19573.2019.8993451