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Metal-oxide based, CMOS-compatible ECRAM for Deep Learning ..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Kim, Seyoung ; Todorov, Teodor ; Onen, Murat... - p. 35.7.1-35.7.4 , 2019
Link: https://doi.org/10.1109/IEDM19573.2019.8993463