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22nm STT-MRAM for Reflow and Automotive Uses with High Yiel..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Gallagher, W.J. ; Lee, George ; Shih, Yi-Chun... - p. 2.7.1-2.7.4 , 2019
Link: https://doi.org/10.1109/IEDM19573.2019.8993469