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Impact of Charge trapping on Imprint and its Recovery in Hf..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Higashi, Y. ; Di Piazza, L. ; Suzuki, M.... - p. 15.6.1-15.6.4 , 2019
Link: https://doi.org/10.1109/IEDM19573.2019.8993472