I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

A High-Speed and High-Reliability TRNG Based on Analog RRAM..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Lin, Bohan ; Gao, Bin ; Pang, Yachuan... - p. 14.8.1-14.8.4 , 2019
Link: https://doi.org/10.1109/IEDM19573.2019.8993486