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1 Ergebnisse
1
A 0.8 µm Smart Dual Conversion Gain Pixel for 64 Megapixels..:
, In:
2019 IEEE International Electron Devices Meeting (IEDM)
,
Park, Donghyuk
;
Joo, Woong
;
Lee, Yunki
... - p. 16.2.1-16.2.4 , 2019
Link:
https://doi.org/10.1109/IEDM19573.2019.8993487
RT T1
2019 IEEE International Electron Devices Meeting (IEDM)
: T1
A 0.8 µm Smart Dual Conversion Gain Pixel for 64 Megapixels CMOS Image Sensor with 12k e- Full-Well Capacitance and Low Dark Noise
UL https://suche.suub.uni-bremen.de/peid=ieee-8993487&Exemplar=1&LAN=DE A1 Park, Donghyuk A1 Joo, Woong A1 Lee, Yunki A1 Nah, Seungjoo A1 Jeong, Heegeun A1 Kim, Bumsuk A1 Jung, Sangil A1 Lee, Jesuk A1 Kim, Yitae A1 Moon, Chang-Rok A1 Park, Yongin A1 Lee, Seung-Wook A1 Han, Jinhwa A1 Jang, Dongyoung A1 Kwon, Heesang A1 Cha, Seungwon A1 Kim, Mihye A1 Lee, Haewon A1 Suh, Sungho YR 2019 SN 2156-017X SP 16.2.1 OP 16.2.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM19573.2019.8993487 DO https://doi.org/10.1109/IEDM19573.2019.8993487 SF ELIB - SuUB Bremen
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