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Filamentary Statistical Evolution from Nano-Conducting Path..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Wu, Ernest ; Ando, Takashi ; Kim, Youngseok... - p. 30.3.1-30.3.4 , 2019
Link: https://doi.org/10.1109/IEDM19573.2019.8993494