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1 Ergebnisse
1
3D-Stacked CAAC-In-Ga-Zn Oxide FETs with Gate Length of 72n:
, In:
2019 IEEE International Electron Devices Meeting (IEDM)
,
Oota, Masashi
;
Hodo, Ryota
;
Ikeda, Takayuki
... - p. 3.2.1-3.2.4 , 2019
Link:
https://doi.org/10.1109/IEDM19573.2019.8993506
RT T1
2019 IEEE International Electron Devices Meeting (IEDM)
: T1
3D-Stacked CAAC-In-Ga-Zn Oxide FETs with Gate Length of 72nm
UL https://suche.suub.uni-bremen.de/peid=ieee-8993506&Exemplar=1&LAN=DE A1 Oota, Masashi A1 Hodo, Ryota A1 Ikeda, Takayuki A1 Yamazaki, Shunpei A1 Ando, Yoshinori A1 Tsuda, Kazuki A1 Koshida, Tatsuki A1 Oshita, Satoru A1 Suzuki, Akio A1 Fukushima, Kunihiro A1 Nagatsuka, Shuhei A1 Onuki, Tatsuya YR 2019 SN 2156-017X SP 3.2.1 OP 3.2.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM19573.2019.8993506 DO https://doi.org/10.1109/IEDM19573.2019.8993506 SF ELIB - SuUB Bremen
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