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Storage Reliability of Multi-bit Flash Oriented to Deep Neu..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Xiang, Y. C. ; Kang, J. F. ; Huang, P.... - p. 38.2.1-38.2.4 , 2019
Link: https://doi.org/10.1109/IEDM19573.2019.8993508