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A Fully Integrated Low Voltage DRAM with Thermally Stable G..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Jang, Sung Ho ; Yamada, Satoru ; Lee, Kyupil... - p. 28.4.1-28.4.3 , 2019
Link: https://doi.org/10.1109/IEDM19573.2019.8993517