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Suppression of Bipolar Degradation in 4H-SiC Power Devices ..:

, In: 2019 IEEE International Electron Devices Meeting (IEDM),
Tsuchida, H. ; Murata, K. ; Tawara, T.... - p. 20.1.1-20.1.4 , 2019
Link: https://doi.org/10.1109/IEDM19573.2019.8993530