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1 Ergebnisse
1
1Gbit High Density Embedded STT-MRAM in 28nm FDSOI Technolo..:
, In:
2019 IEEE International Electron Devices Meeting (IEDM)
,
Lee, K.
;
Kim, W. J.
;
Lee, J. H.
... - p. 2.2.1-2.2.4 , 2019
Link:
https://doi.org/10.1109/IEDM19573.2019.8993551
RT T1 <cTitle>2019 IEEE International Electron Devices Meeting (IEDM)</cTitle>: T1 <Title>1Gbit High Density Embedded STT-MRAM in 28nm FDSOI Technology</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8993551&Exemplar=1&LAN=DE A1 Lee, K. A1 Kim, W. J. A1 Lee, J. H. A1 Bae, B. J. A1 Park, J. H. A1 Kim, I. H. A1 Seo, B. Y. A1 Han, S. H. A1 Ji, Y. A1 Jung, H. T. A1 Park, S. O. A1 Bak, J. H. A1 Kwon, O. I. A1 Kye, J. W. A1 Kim, Y. D. A1 Pae, S. W. A1 Song, Y. J. A1 Jeong, G. T. A1 Hwang, K. H. A1 Koh, G. H. A1 Kang, H. K. A1 Jung, E. S. A1 Kim, Y. J. A1 Kim, C. K. A1 Antonyan, A. A1 Chang, D. H. A1 Hwang, S. H. A1 Lee, G. W. A1 Ji, N. Y. YR 2019 SN 2156-017X SP 2.2.1 OP 2.2.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM19573.2019.8993551 DO https://doi.org/10.1109/IEDM19573.2019.8993551 SF ELIB - SuUB Bremen
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