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1 Ergebnisse
1
A Highly Reliable Back Side Illuminated Pixel against Plasm..:
, In:
2019 IEEE International Electron Devices Meeting (IEDM)
,
Sacchettini, Y.
;
Carrere, J.-P.
;
Doyen, C.
... - p. 16.5.1-16.5.4 , 2019
Link:
https://doi.org/10.1109/IEDM19573.2019.8993561
RT T1 <cTitle>2019 IEEE International Electron Devices Meeting (IEDM)</cTitle>: T1 <Title>A Highly Reliable Back Side Illuminated Pixel against Plasma Induced Damage</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8993561&Exemplar=1&LAN=DE A1 Sacchettini, Y. A1 Carrere, J.-P. A1 Doyen, C. A1 Duru, R. A1 Courouble, K. A1 Ricq, S. A1 Goiffon, V. A1 Magnan, P. YR 2019 SN 2156-017X SP 16.5.1 OP 16.5.4 LK http://dx.doi.org/https://doi.org/10.1109/IEDM19573.2019.8993561 DO https://doi.org/10.1109/IEDM19573.2019.8993561 SF ELIB - SuUB Bremen
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